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Development of USES Specific Aptitude Test Battery for Semiconductor Occupations [microform] : Electronics Inspector (Electronics) II, 726.684-022; Electronics Tester (Electronics) II, 726.684-026; Semiconductor Processor (Electronics), 590.684-022. Analysis and Report
Bib ID 5420798
Format BookBook, MicroformMicroform, OnlineOnline
Author
Employment and Training Administration (DOL), Washington, DC
 
Online Versions
Description [Washington, D.C.] : Distributed by ERIC Clearinghouse, 1981 
29 p. 
Summary

The United States Employment Service (USES) Specific Aptitude Test Battery (SATB) for Semiconductor Occupations is evaluated from three points of view: (1) technical adequacy of the research, (2) fairness to minorities, and (3) usefulness of the battery to United States Employment Service staff and employers in selecting individuals for training in Semiconductor Occupations. Research demonstrated a statistically significant and useful relationship between proficiency in these Semiconductor Occupations and the SATB. The SATB can be expected to produce to useful increase in the proportion of highly proficient workers. When the SATB was applied to the validation sample, composed of individuals who were employed and therefore could be considered competent, an increase from 66 percent to 74 percent in the proportion of highly proficient workers was found. A greater increase can be expected when the battery is used with applicants, as the range of relevant abilities is wider among applicants than among employed workers. The report includes: (1) research summary; (2) procedure; (3) analysis; and, (4) validity of the battery. Descriptive statistics for subgroups of the validation sample; descriptive rating scale; and job description are contained in the appendices. (Author/PN)

Notes

ERIC Note: Appendix 2 marginally legible due to small print. Developed by Southern Test Development Field Center, Raleigh, NC, in cooperation with the Texas State Employment Service.

May also be available online. Address as at 14/8/18: https://eric.ed.gov/

Reproduction Microfiche. [Washington D.C.]: ERIC Clearinghouse microfiches : positive. 
Subjects Aptitude Tests.  |  Electronic Technicians.  |  Electronics.  |  Occupational Tests.  |  Personnel Evaluation.  |  Predictive Measurement.  |  Test Construction.  |  Test Use.  |  Test Validity.  |  Vocational Aptitude.  |  USES Specific Aptitude Test Battery  |  Test Batteries
Form/genre Reports, Research.
Other authors/contributors Employment and Training Administration (DOL), Washington, DC
Available From ERIC 

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